特点
使用速度为 1M 采样/秒的 18 位数字化仪对复杂波形进行采样；存储高达 2750 万个读数
以 0.1 μΩ 和 1 pA 灵敏度测试用于低功率电路中的组件
使用高达 14 ppm 的 1 年期精度直流电压，通过高测试不确定度比率实现测试质量
内置测试脚本处理器 (TSP®) 可在无需控制器交互的情况下执行测试序列，从而减少测试时间和通信开销，同时利用控制器执行其他任务
将源和测量与 2606B 高密度 4 通道源测量单元 (SMU) 和 DMM7512 相结合，可实现 4 通道采样和 2 通道测量功能，而占用的机架空间仅为 2U
无需在 DMM7512 或 2606B 之间提供额外空间以用于热管理
在 TSP-Link 测试系统中最多可控制 32 台仪器
以低于 500 ns 的延迟同步测量值
消除仪器和 PC 之间耗时的通信
DMM7512 TSP 代码与 DMM7510 TSP 代码兼容
The characteristics of
Complex waveforms were sampled using an 18-bit digitizer with a sampling speed of 1M/s. Stores up to 27.5 million readings
In 0.1 mu Ω and 1 pA sensitivity test for low power components in the circuit
The highest test quality is achieved with a high test uncertainty ratio using up to 14 PPM of one-year precision dc voltage
Built-in test script processor (TSP ®) can be performed in the case of without the controller test sequence, thus reducing the test time and communication overhead, at the same time using the controller to perform other tasks
By combining the source and measurement with the 2606B high-density 4-channel source measurement unit (SMU) and DMM7512, the 4-channel sampling and 2-channel measurement functions can be realized, and the rack space occupied is only 2U
There is no need to provide additional space between DMM7512 or 2606B for thermal management
Up to 32 instruments can be controlled in the TSP-Link test system
The measurements were synchronized with a delay of less than 500 ns
Eliminates time-consuming communication between the instrument and the PC
DMM7512 TSP code is compatible with DMM7510 TSP code
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